Description
Product Overview
The NI PXIe-4142 is a four-channel PXI Express Source Measure Unit (SMU) designed for automated electrical characterization, semiconductor testing, and high-pin-count measurement systems. Each channel can source and measure both voltage and current, providing four-quadrant operation across ±24 V and ±150 mA ranges. Integrated remote four-wire sensing improves measurement accuracy by compensating for voltage drop in test wiring. NI also provides hardware-timed sequencing and synchronization through the PXI backplane, making the instrument suitable for automated I-V characterization and transient testing. The module uses a 3U, one-slot PXI Express form factor and a 25-position D-SUB front connector.
Technical Specifications — PXIe-4142
| Parameter | Value |
|---|---|
| Product Model | PXIe-4142 |
| Manufacturer | National Instruments (NI) |
| Product Type | PXI Express Source Measure Unit |
| Number of Channels | 4 |
| Voltage Range | ±24 V |
| Maximum Current | ±150 mA |
| Operation | 4-quadrant source and sink |
| Power Capability | Up to 3.6 W per channel |
| Remote Sense | 4-wire sensing |
| Maximum Sample Rate | 600 kS/s per channel |
| Maximum Source Update Rate | 100 kS/s per channel |
| Form Factor | 3U, one-slot PXI Express |
| Dimensions (H × W × D) | 20 × 130 × 216 mm |
| Weight | Approx. 412 g |
| Front Connector | 25-position D-SUB |
| Operating Temperature | 0 to 55°C |
| Storage Temperature | -40 to 70°C |
| Calibration Interval | Recommended 1 year |
NI specifies four-channel operation, ±24 V maximum voltage, ±150 mA maximum current, and 4-quadrant operation. The module supports sample rates up to 600 kS/s per channel and source updates up to 100 kS/s per channel.

NI PXIe-4142
Key Features and Benefits — PXIe-4142
- Four independent SMU channels
- ±24 V voltage capability
- ±150 mA current capability
- Four-quadrant source and sink operation
- Integrated remote four-wire sensing
- Hardware-timed sequencing
- PXI backplane synchronization
- Up to 600 kS/s sampling per channel
- Suitable for automated I-V characterization
- Compact one-slot PXI Express architecture
The combination of channel density and synchronized measurement makes this module useful where several devices or pins must be characterized in parallel. NI specifically positions the PXIe-414x family for high-channel-count applications such as semiconductor and MEMS testing.
Related Models
NI PXIe-4141: A four-channel SMU with ±10 V and ±100 mA capability, suitable for lower-voltage characterization.
NI PXIe-4143: A closely related four-channel SMU offering ±24 V and ±150 mA capability with different measurement specifications.
NI PXIe-4144: A four-channel SMU designed for applications requiring higher current sensitivity within a ±6 V range.
NI PXIe-4145: A four-channel, ±6 V, ±500 mA SMU for applications requiring substantially higher current output.
Installation and Maintenance — PXIe-4142
Install the module in a compatible PXI Express chassis and ensure adequate chassis cooling. Before connecting a device under test, verify the expected voltage, current, and power boundaries for every channel. Use the Output HI/LO terminals for local sensing or the Sense HI/LO terminals when remote four-wire measurement is required.
Protect the front connector from contamination and mechanical stress. For precision applications, maintain the recommended calibration interval and document calibration status before deploying the module in a production test system.
Personally, I would verify the complete I-V operating envelope before selecting this SMU. The ±24 V and ±150 mA headline ratings do not by themselves define the permissible operating point across every load condition.
Product Warranty — PXIe-4142
Warranty coverage depends on the supplier, equipment condition, and purchase agreement. For new, surplus, or refurbished inventory, confirm the exact part number, serial number, calibration status, functional-test results, and warranty period before purchase.
The NI PXIe-4142 is best suited to automated test systems where synchronized, multi-channel source-and-measure capability is required. Its PXI Express form factor also makes it practical for high-density test racks and semiconductor characterization platforms.
中文版
Phone:
Email:
WhatsApp: