Agilent E1413C | 16-Bit 100 kSa/s VXI Data Acquisition Others

$1,450.00

A 64-channel input count, 16-bit conversion, and up to 100 kSa/s scanning rate define the Agilent E1413C as a high-density VXI data-acquisition module rather than a general-purpose PLC analog card.
Brand model:Agilent 
Product Name:E1413C
Warranty: 1 year
Origin:USA
HS code:85389000.00
Inventory: Spot/Futures
Goods condition: Brand new
Delivery time: 3-4days/1month

Category: Brand:

Description

  • Model: E1413C
  • Brand: Agilent Technologies
  • Series: 75000 Series C VXI
  • Core Function: High-speed multi-channel analog data acquisition
  • Type: 64-channel scanning A/D converter
  • Key Specs: 16-bit resolution; 100 kSa/s maximum scan rate; 64 kSa dual-ported FIFO buffer
  • Lifecycle: Legacy instrument; availability depends on surplus stock

Product Introduction

A 64-channel input count, 16-bit conversion, and up to 100 kSa/s scanning rate define the Agilent E1413C as a high-density VXI data-acquisition module rather than a general-purpose PLC analog card. It is a C-size, single-slot, register-based VXI instrument intended for high-performance measurement and computer-aided test systems.

For engineers maintaining older automated test equipment, the value is straightforward: substantial channel density in one VXI slot, with automatic self-calibration and a 64 kSa dual-ported FIFO for fast data transfer. The module can use Signal Conditioning Plug-ons (SCPs), with the available measurement range determined by the selected SCP. Well, technically, the headline 100 kSa/s figure is the aggregate scanning rate; the effective per-channel rate decreases as more channels are included in the scan list.

Key Technical Specifications

Parameter Specification
Model E1413C
Manufacturer Agilent Technologies
Product Type High-speed 64-channel scanning A/D converter
Form Factor C-size, 1-slot VXI
Architecture Register-based VXI module
Number of Channels 64 differential channels
A/D Resolution 16-bit
Maximum Scan Rate 100 kSa/s aggregate
Accuracy 0.01% of reading
Standard Full-Scale Range 4 mV to 16 V, depending on SCP
Extended Voltage Range Up to 60 V with E1513A attenuator SCP
FIFO Buffer 64 kSa dual-ported FIFO
Signal Conditioning Up to 8 SCP positions
Calibration Automatic self-calibration
Monitoring Buffer Current Value Table / current-value buffer
Intended Applications Data acquisition and computer-aided test

The published data sheet confirms the 16-bit converter, 64-channel differential FET multiplexer, 100 kSa/s maximum sampling/scanning rate, 64 kSa FIFO, automatic self-calibration, and SCP-based signal conditioning.

Agilent E1413C

Agilent E1413C

Key Features and Practical Benefits

  • 64 measurement channels in a single VXI slot.
  • 16-bit conversion for higher-resolution analog measurements.
  • 100 kSa/s maximum aggregate rate for fast scanning applications.
  • 64 kSa dual-ported FIFO helps transfer measurement data efficiently.
  • SCP architecture allows signal conditioning to be matched to the measurement task.
  • Automatic self-calibration reduces routine calibration effort.
  • Current-value monitoring is available while acquisition is running.
  • Suitable for automated test equipment, laboratory measurement systems, and legacy data-acquisition platforms.

The SCP arrangement deserves attention during procurement. Every input requires an SCP, and the selected SCP determines the practical input conditioning and measurement range.

Related Models

E1313A — Functionally similar scanning A/D architecture in a B-size VXI implementation, with 32 measurement channels.

E1413B — Earlier 64-channel scanning A/D module in the same general VXI measurement family.

E1513A — Voltage attenuator Signal Conditioning Plug-on used to extend the measurement range to 60 V with compatible E1413C configurations.

E1419A — VXI multifunction measurement and control module for applications requiring more than scanning A/D acquisition. Keysight lists the E1413C and E1419A among its VXI measurement and control products.

Installation and Maintenance

Before replacement, check the VXI chassis, slot assignment, SCP configuration, scan list, and application software. Do not assume another 64-channel board is electrically equivalent.

For a field spare, record the installed SCP types and their channel positions before removal. Inspect the VXI connector and module contacts for contamination. After installation, verify identification, self-test status, channel readings, scan timing, FIFO operation, and application-level data transfer.

A common mistake is checking only the base module. The SCP configuration can materially change the actual measurement capability, so the accessory identification matters just as much as the E1413C chassis card.

Inspection and Test Before Shipment

For a used or surplus unit, a sensible inspection sequence is:

  • Confirm part number, serial number, and visible hardware revision.
  • Inspect the PCB and VXI connector for corrosion, damage, or repair evidence.
  • Power the module in a compatible VXI test chassis and verify startup diagnostics.
  • Check representative analog channels with calibrated test signals.
  • Verify scanning operation and data transfer through the FIFO.
  • Confirm installed SCP identification where applicable.
  • Record the test results in a Test Report.

Actual calibration status should be stated separately from functional testing. A module that passes a functional test is not automatically a recently calibrated instrument.

Product Warranty

Warranty depends on supplier condition and sales terms. For surplus or refurbished instrumentation, procurement records should identify the exact model, serial number, tested functions, calibration status, and warranty period.

The Agilent E1413C is a legacy VXI measurement module, so direct compatibility depends on the existing VXI chassis, software environment, SCP configuration, and application requirements. Keysight continues to provide the original E1313A/E1413C user manual, while its published warranty information lists the E1413C within its 75000 Series C instrumentation.

Procurement note: availability is typically driven by surplus and used-instrument inventory rather than normal new-product production. For a critical test system, matching the SCP configuration and verifying actual measurement performance before shipment is the safer purchasing approach.